{"id":10,"date":"2021-05-28T12:13:42","date_gmt":"2021-05-28T12:13:42","guid":{"rendered":"https:\/\/dev-cu-sites.pantheonsite.io\/jseo\/?page_id=10"},"modified":"2025-09-17T14:43:05","modified_gmt":"2025-09-17T14:43:05","slug":"publications","status":"publish","type":"page","link":"https:\/\/sites.clarkson.edu\/jseo\/publications\/","title":{"rendered":"Publications"},"content":{"rendered":"\n<h2 class=\"wp-block-heading\" id=\"peer-reviewed-publications-29-papers-4-book-chapters-23-patents\">Peer-reviewed Publications<\/h2>\n\n\n\n<h3 class=\"wp-block-heading\">(62 papers, 4 book chapters, 24 patents)<\/h3>\n\n\n\n<h3 class=\"wp-block-heading\">Submitted<\/h3>\n\n\n\n<p>65. <strong>S. Ryu<\/strong>, <strong>C. Larson<\/strong>, P.J. Kim, J. Choi, K. Lee*, and\u00a0<strong><u>J. Seo*<\/u><\/strong> Mechanism of Surface Passivation by Sulfur-Containing Amino Acids in Corrosion Inhibition of Molybdenum in Chemical Mechanical Planarization,\u00a0<em>Submitted<\/em>.<\/p>\n\n\n\n<p>64. A. Khanmohammadi*, G. Ahmadi, S. Krishnan, <strong>A. Sadrimofakham<\/strong>, R. Muralidaran, C. Lim, D. Kwon, B. Kim, and <strong>J. Seo<\/strong>, A Model for Electric Field-Assisted and Flow-Induced Ceria Nanoparticle Removal with Applications to Post-CMP Cleaning, <em>Submitted<\/em>.<\/p>\n\n\n\n<p>63. Atomic-Level Insights and Machine Learning for Rational Corrosion Inhibitor Design in Copper CMP, <em>Submitted<\/em>.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">2025<\/h3>\n\n\n\n<p>62. S. Lee, S. Yang, M. Kang, Y. Bae, K. Lee, Y. Jung, Y. Kim, J. Kim, K. Roh, <strong>J. Seo<\/strong>, S. Cho, J. Choi, T. Kim,&nbsp;P.J. Kim,&nbsp;Boosting Electrochemical Stability and Reversibility in Anode-Free Lithium Metal Batteries via Lithiatable Supporter Incorporation in Current Collectors,&nbsp;NPJ Flexible Electronics,&nbsp;<em>Accepted<\/em>.&nbsp;<\/p>\n\n\n\n<p>61. <strong>S. Ryu<\/strong>, <strong>M. Ramu<\/strong>, P. J. Kim, J. Choi, K. Lee, <strong>J. Seo*<\/strong>, Review on Atomistic and Quantum Mechanical Simulation Approaches in Chemical Mechanical Planarization, Applied Surface Science Advances, 2025.<\/p>\n\n\n\n<p>60. <strong>R. Venkataswamy<\/strong>, <strong>M. Ramu<\/strong>, <strong>J. Seo*<\/strong>, Toward Eco-Friendly CMP Process: Emerging Trends and Strategies for Reducing Environmental Footprint, <a href=\"https:\/\/pubs.acs.org\/doi\/full\/10.1021\/acs.estlett.5c00635\" target=\"_blank\" rel=\"noreferrer noopener\">Environmental Science &amp; Technology Letters<\/a>, 2025. <strong>(Journal Cover)<\/strong><\/p>\n\n\n\n<p>59. S. Yang, S. Lee, M. Kang, K. Roh, <strong><u>J. Seo<\/u><\/strong>, D. Lee, K. Kim, S. Lee, S. Cho, P.J. Kim*, J. Choi*, Insights into improving Li-ion Transference Number and Li Deposition Uniformity toward High-Current-Density Lithium Metal Anode, Carbon Energy, 2025, Accepted. <strong>(Journal Cover)<\/strong><\/p>\n\n\n\n<p>58. S. Lee, D. Lee, J. Kang, S. Yang, M. Kang, W. Jo, <strong>J. Seo<\/strong>, S. Cho, P.J. Kim, J. Choi, Anode SHIELD: A Surface Hybrid Interlayer for High\u2010Capacity Anodes Toward Safe and Stable Lithium\u2010Ion Batteries, <a href=\"https:\/\/advanced.onlinelibrary.wiley.com\/doi\/full\/10.1002\/adfm.202513744\" target=\"_blank\" rel=\"noreferrer noopener\">Advanced Functional Materials<\/a>, 2025, e13744. <strong>(Journal Cover)<\/strong><\/p>\n\n\n\n<p>57. H. Seo,<strong>&nbsp;S. Ryu<\/strong>,&nbsp;<strong>J. Seo<\/strong>, P.J. Kim, J. Yoo*, Boosting Selenium Cathode Performance through Kinetic Optimization, <a href=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S0378775325009589\" target=\"_blank\" rel=\"noreferrer noopener\">Journal of Power Sources<\/a>,&nbsp;2025, 645, 237122.<\/p>\n\n\n\n<p>56. <strong>H. Tran<\/strong>, M. Moinpour, A. Rawat, E. J. Podlaha, and&nbsp;<strong>J. Seo*<\/strong>, Dynamic Electrochemical Behavior of Cu and Co in Amino Acid-Based Slurries for Chemical Mechanical Planarization, <a href=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S2468023025007862\" target=\"_blank\" rel=\"noreferrer noopener\">Surfaces and Interfaces<\/a>, 2025, 65, 106529.<\/p>\n\n\n\n<p>55. <strong>S. Ryu<\/strong>, M. Moinpour, A. Rawat, P. Kim, E. J. Podlaha, and&nbsp;<strong>J. Seo*<\/strong>, Molecular Interactions of Amino Acids for Corrosion Control in Molybdenum CMP Through Bridging Experimental Insights and DFT Simulations, <a href=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S0169433225007603\" target=\"_blank\" rel=\"noreferrer noopener\">Applied Surface Science<\/a>, 2025, 698, 163046.<\/p>\n\n\n\n<p>54. C. Jani, <strong>R. <strong>Venkataswamy<\/strong><\/strong>, <strong>J. Seo<\/strong>, and S. Krishnan*, Revisiting the Roles of Chelator, Inhibitor, Oxidant, and Abrasive in High-Rate Copper CMP, <a href=\"https:\/\/iopscience.iop.org\/article\/10.1149\/2162-8777\/adc59e\" target=\"_blank\" rel=\"noreferrer noopener\">ECS Journal of Solid State Science and Technology<\/a>, 2025, 14, 044003.<\/p>\n\n\n\n<p>53. Y. Terayama*, P. Khajornrungruang*,&nbsp;<strong>J. Seo<\/strong>, H. Satomi, Y. Wada, H. Hiyama, Direct Observation of Sub-100 nm Silica Particle Detachment: Lateral Force and Evanescent Microscope study,&nbsp;<a href=\"https:\/\/iopscience.iop.org\/article\/10.1149\/2162-8777\/adc509\" target=\"_blank\" rel=\"noreferrer noopener\">ECS Journal of Solid State Science and Technology<\/a>, 2025, 14, 044004.<\/p>\n\n\n\n<p>52.&nbsp;<strong>H. Tran<\/strong>, E. J. Podlaha, and&nbsp;<strong>J. Seo*<\/strong>, Green Chemistry in CMP Through a Comparison of Amino Acid Degradability and Environmental Impact with Benzotriazole in Advanced Oxidation Processes,&nbsp;<a href=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S2213343724032664\" target=\"_blank\" rel=\"noreferrer noopener\">Journal of Environmental Chemical Engineering<\/a>, 2024, 115134.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">2024<\/h3>\n\n\n\n<p>51.&nbsp;<strong>A. S. Mofakham<\/strong>, H. Kim, H. Cho, K. Lee, G. Ahmadi,&nbsp;<strong>J. Seo*<\/strong>, Enhancing CMP Performance through Micro-Structured Pad Patterns: Insights from CFD Simulations and Experimental Evaluations,&nbsp;<a href=\"https:\/\/iopscience.iop.org\/article\/10.1149\/2162-8777\/ad8fd3\/meta\" target=\"_blank\" rel=\"noreferrer noopener\">ECS Journal of Solid State Science and Technology<\/a>, 2024.<\/p>\n\n\n\n<p>50. R. Venkataswamy, L. Trimble, S. Ryu, N. Le, K. Park, H. Kang, <strong>J. Seo*<\/strong>, Atomic-Level Insights into CeO2 Performance: Chemical Interactions in CMP Explored through CeO2-SiO2 Studies, <a href=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S0272884224039026\" target=\"_blank\" rel=\"noreferrer noopener\">Ceramic Internationals<\/a>, 2024.<\/p>\n\n\n\n<p>49. Y. Terayama*, P. Khajornrungruang, K. Suzuki, <strong>J. Seo<\/strong>, H. Satomi, Y. Wada, H. Hiyama, Detachment Energy Evaluation in the Nano-particle Cleaning by using Lateral Force Microscopy, <a href=\"https:\/\/www.mdpi.com\/2076-3417\/14\/18\/8145\" target=\"_blank\" rel=\"noreferrer noopener\">Applied Sciences<\/a>, 2024, 14 (18) 8145.<\/p>\n\n\n\n<p>48. H. Tran, J. Guchovi, J. Commane, E. J. Podlaha, <strong>J. Seo*<\/strong>, Examining Amino Acids as Environmentally Friendly Corrosion Inhibitors for Cu and Co Chemical Mechanical Planarization, <a href=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S2213343724017998?casa_token=e5UkMgP7tmEAAAAA:8Des06iifn0nNLA9mxi4sguTEPUt0Ws_SjXmGoJ97p1WTZsvadrpdnbB2kuqzBLh3gcixhcBPw\" target=\"_blank\" rel=\"noreferrer noopener\">Journal of Environmental Chemical Engineering<\/a>, 2024, 113669.<\/p>\n\n\n\n<p>47. V-T. Nguyen, J. Wait, T. Nishi, S. Hamada, H. Himaya, and <strong>J. Seo*<\/strong>, Systematic Root Cause Analysis of Ceria-Induced Defects during Chemical Mechanical Planarization and Cleaning, <a href=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S1526612524007606\" target=\"_blank\" rel=\"noreferrer noopener\">Journal of Manufacturing Processes<\/a>, 2024, 127, 15, 27-34.<\/p>\n\n\n\n<p>46. S. Choi, J. Yim, J. Lim, S. Kim, Y. Jeong, K. Bae, <strong>J. Seo<\/strong><em>, <\/em>K. Lee, Tailored electrostatic attraction force between anionic polymer and Si3N4 film in consecutive gate poly open CMP, <a href=\"https:\/\/id.elsevier.com\/as\/authorization.oauth2?platSite=SD%2Fscience&amp;additionalPlatSites=GH%2Fgeneralhospital%2CMDY%2Fmendeley%2CSC%2Fscopus&amp;scope=openid%20email%20profile%20els_auth_info%20els_idp_info%20els_idp_analytics_attrs%20urn%3Acom%3Aelsevier%3Aidp%3Apolicy%3Aproduct%3Ainst_assoc&amp;response_type=code&amp;redirect_uri=https%3A%2F%2Fwww.sciencedirect.com%2Fuser%2Fidentity%2Flanding&amp;authType=SINGLE_SIGN_IN&amp;prompt=none&amp;client_id=SDFE-v4&amp;state=retryCounter%3D0%26csrfToken%3D82fa4dd8-d2b1-470d-9539-9f1b1da65de1%26idpPolicy%3Durn%253Acom%253Aelsevier%253Aidp%253Apolicy%253Aproduct%253Ainst_assoc%26returnUrl%3D%252Fscience%252Farticle%252Fpii%252FS1369800124006577%26prompt%3Dnone%26cid%3Darp-6c5c519c-8eaa-48d4-8ad4-8f8982388721\" target=\"_blank\" rel=\"noreferrer noopener\">Materials Science in Semiconductor Processing<\/a>, 2024, 184, 108761.<\/p>\n\n\n\n<p>45. R. Venkataswamy, L. Trimble, A. McDonald, D. Nevers, L. V. Bengochea, A. Carswell, A. Rossner*, <strong>J. Seo*,<\/strong> Environmental Impact Assessment of Chemical Mechanical Planarization Consumables: Challenges, Future Needs, and Perspectives, <a href=\"https:\/\/pubs.acs.org\/doi\/full\/10.1021\/acssuschemeng.4c03195?casa_token=9MgXN7oYCbMAAAAA%3AwF7SA7U9u0iWV3e8zkk984nbH1cXf3OWV0SM8ZyCKoif0QmB_xTYuf3nZGLHCGfNk03XO_W4g6KKMO8\" target=\"_blank\" rel=\"noreferrer noopener\">ACS Sustainable Chemistry &amp; Engineering<\/a>, 2024. <strong>(Review Paper) (Journal Cover)<\/strong><\/p>\n\n\n\n<p>44. S. Park, <strong>J. Seo*<\/strong>, Comparative First-Principles Analysis of Crystalline vs. Amorphous CeO2 Particles: Implications for Chemical Mechanical Planarization, <a href=\"https:\/\/link.springer.com\/article\/10.1007\/s10853-024-09861-5\" target=\"_blank\" rel=\"noreferrer noopener\">Journal of Materials Science<\/a>, 2024, 59, 11405-11415.<\/p>\n\n\n\n<p>43. M. Park, S. Woo, <strong>J. Seo<\/strong>, J. Choi, E. Jeong, P.J. Kim, Directing the uniform and dense Li deposition via graphene-enhanced separators for high-stability Li metal batteries, <a href=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S0013468624006674\" target=\"_blank\" rel=\"noreferrer noopener\">Electrochemical Acta<\/a>, 2024, 495, 144426.<\/p>\n\n\n\n<p>42. A. Othman+, A. Gowda+, D. Andreescu, M. Hassan, S. Babu, <strong>J. Seo<\/strong><em><strong>*,<\/strong> <\/em>S. Andreescu*, Two decades of ceria nanoparticles research: structure, properties and emerging applications, <a href=\"https:\/\/pubs.rsc.org\/en\/content\/articlelanding\/2024\/mh\/d4mh00055b\" target=\"_blank\" rel=\"noreferrer noopener\">Materials Horizons<\/a>, 2024. (Review Paper)<\/p>\n\n\n\n<p>41. A. Venkataronappa, J. Bankaitis, <strong>J. Seo*<\/strong>, Enhancing Dispersion Stability and Recyclability of Ceria Slurry with Polyacrylic Acid for Improved Glass Polishing Performance, <a href=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S1226086X2400279X\" target=\"_blank\" rel=\"noreferrer noopener\">Journal of Industrial and Engineering Chemistry<\/a>, 2024.<\/p>\n\n\n\n<p>40. <strong>J. Seo<\/strong>, S. Ryu, J. Kwon, K. Lee*, Structural Dependency of Pyridine Carboxylic Acid Isomers in Metal-Organic Coordination Adsorption, <a href=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S0169433224008626\" target=\"_blank\" rel=\"noreferrer noopener\">Applied Surface Science<\/a>, 2024, 663, 160149.<\/p>\n\n\n\n<p>39. <strong>J. Seo<\/strong>, J. Hur, S. Kim, Y. Kim, Y. Kim, K. Bae, K. Lee, and G. An, Recovery and Reuse of Magnetic Silica-Coated Iron Oxide Particles for Eco-Friendly Chemical Mechanical Planarization, <a href=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S0927775724009257\" target=\"_blank\" rel=\"noreferrer noopener\">Colloids and Surfaces A: Physicochemical and Engineering Aspects<\/a>, 2024, 694, 134064.<\/p>\n\n\n\n<p>38. M. Liu, B. Zhang*, <strong>J. Seo*,<\/strong> W. Xian, D. Cui, P. Wu, Y. Wang, S. Liu, Development of Highly Stable Ceria Slurry in Acetic Acid-Ammonium Acetate Buffer System for Effective Silica Chemical Mechanical Planarization, <a href=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S136980012400307X\" target=\"_blank\" rel=\"noreferrer noopener\">Materials Science in Semiconductor Processing<\/a>, 2024, 108411.<\/p>\n\n\n\n<p>37. D. Lee+, S. Lee+, D. Jung, K. Roh, <strong>J. Seo<\/strong>, J. Kim, K. Kim, P.J. Kim<em>, J. Choi<\/em>, Synergistically Enhanced LiF-rich Protective Layer for Highly Stable Silicon Anodes, <a href=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S0169433224007360\">Applied Surface Science<\/a>, 2024, 160023.<\/p>\n\n\n\n<p>36. A. Othman, H. Kim, R. Trivedi, T. Kulasingam, <strong>J. Seo*<\/strong>, Understanding and Mitigating Temperature-Induced Agglomeration in Silica-based Chemical Mechanical Planarization (CMP) Slurry Storage, <a href=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S0927775724006630\" target=\"_blank\" rel=\"noreferrer noopener\">Colloids and Surfaces A: Physicochemical and Engineering Aspects<\/a>, 2024,133802.<\/p>\n\n\n\n<p>35. K. Kwon, J. Kim, S. Han, J. Lee, J. Kwon, J. Lee, <strong>J. Seo<\/strong>, P.J. Kim, T. Song, J. Choi*, Low-Resistance LiFePO4 Thick Film Electrode Processed with Dry Electrode Technology for High-Energy-Density Lithium-Ion Batteries, <a href=\"https:\/\/onlinelibrary.wiley.com\/doi\/full\/10.1002\/smsc.202300302\" target=\"_blank\" rel=\"noreferrer noopener\">Small-Science<\/a>, 2024, 2300302. <strong>(Journal Cover)<\/strong><\/p>\n\n\n\n<p>34. S. Yang, J. Kim, S. Lee, <strong>J. Seo<\/strong>, J. Choi, P.J. Kim, Uniform Li Deposition through the Graphene-Based Ion-Flux Regulator for High-Rate Li Metal Batteries, <a href=\"https:\/\/pubs.acs.org\/doi\/full\/10.1021\/acsami.3c15746\" target=\"_blank\" rel=\"noreferrer noopener\">ACS Applied Materials &amp; Interfaces<\/a>, 2024, 16, 3, 3416-3426.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\" id=\"2022\">2022<\/h3>\n\n\n\n<p>33. K. Lee, S. Kim, S. Sun, G. Lee, J. Kwon, J. Hwang, <strong><strong><strong>J. Seo<\/strong><\/strong><\/strong>, U. Paik, T. Song, Hydrogenated Ceria Nanoparticles for High-Efficiency Silicate Adsorption, <em><strong>New J. Chem<\/strong><\/em>, 2022.<\/p>\n\n\n\n<p>32. <strong><strong>J. Seo<\/strong><\/strong>*, K. Kim, H. Kang, S.V. Babu, Perspective-Recent advances and perspectives on ceria particle applications in chemical mechanical planarization, <em><strong><em><strong><em>ECS Journal of Solid State Science and Technology,<\/em><\/strong><\/em><\/strong><\/em> 2022, 11, 084003.<em> <\/em><strong>(Perspective article)<\/strong><\/p>\n\n\n\n<figure class=\"wp-block-image size-large is-resized\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"340\" src=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2022\/07\/Fig-1024x340.jpg\" alt=\"Graphic of &quot;Perspective-Recent advances and perspectives on ceria particle applications in chemical mechanical planarization.&quot; Please contact jseo@clarkson.edu for more information.\" class=\"wp-image-1051\" style=\"width:689px;height:228px\" srcset=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2022\/07\/Fig-1024x340.jpg 1024w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2022\/07\/Fig-300x100.jpg 300w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2022\/07\/Fig-768x255.jpg 768w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2022\/07\/Fig-360x120.jpg 360w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2022\/07\/Fig.jpg 1500w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/figure>\n\n\n\n<p>31. C. K. Ranaweera, S.V. Babu, S. Hamada, <strong><strong>J. Seo<\/strong><\/strong>*, Measurement of the force required to move ceria particles from SiO2 surfaces using lateral force microscopy, <em><strong><em>Journal of Materials Research,<\/em><\/strong> 202<\/em>2.<\/p>\n\n\n\n<figure class=\"wp-block-image size-full is-resized\"><img loading=\"lazy\" decoding=\"async\" width=\"900\" height=\"523\" src=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2022\/05\/Picture1.png\" alt=\"Graphic for &quot;Measurement of the force required to move ceria particles from SiO2 surfaces using lateral force microscopy.&quot; Please contact jseo@clarkson.edu for more information.\" class=\"wp-image-883\" style=\"width:527px;height:306px\" srcset=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2022\/05\/Picture1.png 900w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2022\/05\/Picture1-300x174.png 300w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2022\/05\/Picture1-768x446.png 768w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2022\/05\/Picture1-360x209.png 360w\" sizes=\"auto, (max-width: 900px) 100vw, 900px\" \/><\/figure>\n\n\n\n<p>30. K. Lee, <strong>J. Seo<\/strong>, Suppression of Dissolution Rate via Coordination Complex in Tungsten CMP, <strong><em><strong><em>Applied Sciences,<\/em><\/strong><\/em><\/strong> 2022, 12(3).<\/p>\n\n\n\n<h3 class=\"wp-block-heading\" id=\"2021\">2021 <\/h3>\n\n\n\n<p>29. <strong>J. Seo<\/strong>*, A. Othman, H. J. Kim, J. Devabhaktuni, R. Trivedi, D. Penigalapati, T. Kulasingam, H. Vegi, S. V. Babu, Storage Temperature Effects on the Slurry Health Parameters and SiO2 Removal Rates during Chemical Mechanical Polishing, <strong><em><strong><em>ECS Journal of Solid State Science and Technology,<\/em><\/strong><\/em><\/strong> 2021, 10, 104002.<\/p>\n\n\n\n<figure class=\"wp-block-image size-large is-resized is-style-default\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"426\" src=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2835-Oct.-17-16.07-1-1024x426.jpg\" alt=\"Graphic for &quot;Storage Temperature Effects on the Slurry Health Parameters and SiO2 Removal Rates during Chemical Mechanical Polishing.&quot; For more information contact jseo@clarkson.edu.\" class=\"wp-image-567\" style=\"width:480px;height:199px\" srcset=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2835-Oct.-17-16.07-1-1024x426.jpg 1024w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2835-Oct.-17-16.07-1-300x125.jpg 300w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2835-Oct.-17-16.07-1-768x319.jpg 768w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2835-Oct.-17-16.07-1-360x150.jpg 360w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2835-Oct.-17-16.07-1.jpg 1042w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/figure>\n\n\n\n<p>28. C. K. Ranaweera, P. Khajornrungruang, S. Hamada, A. Gowda, H. Vegi, <strong><strong><strong>J. Seo<\/strong><\/strong>*,<\/strong> and S.V. Babu, Real-Time Visualization of the Cleaning of Ceria Particles from Silicon Dioxide Films Using PVA Brush Scrubbing, <strong><em><strong><em>ECS Journal of Solid State Science and Technology,<\/em><\/strong><\/em><\/strong> 2021, 10, 084004.<\/p>\n\n\n\n<figure class=\"wp-block-image size-full is-resized is-style-default\"><img loading=\"lazy\" decoding=\"async\" width=\"822\" height=\"743\" src=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2836-Oct.-17-16.09.jpg\" alt=\"Graphic for &quot;Visualization of the Cleaning of Ceria Particles from Silicon Dioxide Films Using PVA Brush Scrubbing.&quot; For more information please contact jseo@clarkson.edu.\" class=\"wp-image-568\" style=\"width:436px;height:394px\" srcset=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2836-Oct.-17-16.09.jpg 822w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2836-Oct.-17-16.09-300x271.jpg 300w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2836-Oct.-17-16.09-768x694.jpg 768w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2836-Oct.-17-16.09-299x270.jpg 299w\" sizes=\"auto, (max-width: 822px) 100vw, 822px\" \/><\/figure>\n\n\n\n<p>27. <strong>J. Seo<\/strong>*, A review on chemical and mechanical phenomena at the wafer interface during chemical mechanical planarization,<strong><em> Journal of Materials Research,<\/em><\/strong> 2021, P1-23. <strong>(Review article), Early Career Scholars in Material Science<\/strong><\/p>\n\n\n\n<figure class=\"wp-block-image size-full is-resized is-style-default\"><img loading=\"lazy\" decoding=\"async\" width=\"608\" height=\"339\" src=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2837-Oct.-17-16.11.jpg\" alt=\"Graphic for &quot;A review on chemical and mechanical phenomena at the wafer interface during chemical mechanical planarization.&quot; For more information please contact jseo@clarkson.edu\" class=\"wp-image-569\" style=\"width:438px;height:244px\" srcset=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2837-Oct.-17-16.11.jpg 608w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2837-Oct.-17-16.11-300x167.jpg 300w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2837-Oct.-17-16.11-360x201.jpg 360w\" sizes=\"auto, (max-width: 608px) 100vw, 608px\" \/><\/figure>\n\n\n\n<h3 class=\"wp-block-heading\" id=\"2020\">2020 <\/h3>\n\n\n\n<p>26. <strong>J. Seo (Corresponding)<\/strong>*<strong>,<\/strong> A. Gowda*, P. Khajornrungruang, S. Hamada, and S.V. Babu, 3D Trajectories and Diffusion of Single Ceria Particles near a Glass Surface and their Removal, <strong><em>Journal of Materials Research,<\/em><\/strong> 2020, P1-10. <strong>Early Career Scholars in Material Science<\/strong><\/p>\n\n\n\n<figure class=\"wp-block-image size-full is-resized is-style-default\"><img loading=\"lazy\" decoding=\"async\" width=\"765\" height=\"391\" src=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2838-Oct.-17-16.12.jpg\" alt=\"Graphic for &quot;3D Trajectories and Diffusion of Single Ceria Particles near a Glass Surface and their Removal.&quot; For more information please contact jseo@clarkson.edu.\" class=\"wp-image-572\" style=\"width:448px;height:229px\" srcset=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2838-Oct.-17-16.12.jpg 765w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2838-Oct.-17-16.12-300x153.jpg 300w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2838-Oct.-17-16.12-360x184.jpg 360w\" sizes=\"auto, (max-width: 765px) 100vw, 765px\" \/><\/figure>\n\n\n\n<p>25. <strong>J. Seo (Corresponding)<\/strong>*<strong>,<\/strong> A. Gowda*, P. Khajornrungruang, S. Hamada, T. Song, and S.V. Babu, Trajectories, Diffusion, and Interactions of Single Ceria Particles on a Glass Surface Observed by Evanescent Wave Microscopy, <strong><em>Journal of Materials Research,<\/em><\/strong> 2020, 35 (3), P321-331.<\/p>\n\n\n\n<figure class=\"wp-block-image size-full is-resized is-style-default\"><img loading=\"lazy\" decoding=\"async\" width=\"810\" height=\"516\" src=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2839-Oct.-17-16.17.jpg\" alt=\"Graphic for &quot;Trajectories, Diffusion, and Interactions of Single Ceria Particles on a Glass Surface Observed by Evanescent Wave Microscopy.&quot; For more information please contact jseo@clarkson.edu\" class=\"wp-image-573\" style=\"width:466px;height:296px\" srcset=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2839-Oct.-17-16.17.jpg 810w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2839-Oct.-17-16.17-300x191.jpg 300w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2839-Oct.-17-16.17-768x489.jpg 768w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2839-Oct.-17-16.17-360x229.jpg 360w\" sizes=\"auto, (max-width: 810px) 100vw, 810px\" \/><\/figure>\n\n\n\n<p>24. A. Gowda, <strong>J. Seo<\/strong>, C.K. Ranaweera, S.V. Babu, Cleaning Solutions for Removal of \u223c30 nm Ceria Particles from Proline and Citric Acid Containing Slurries Deposited on Silicon Dioxide and Silicon Nitride Surfaces,<strong><em> ECS Journal of Solid State Science and Technology,<\/em><\/strong><em> <\/em>2020, 9 (4), 004013.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\" id=\"2019\">2019 <\/h3>\n\n\n\n<p>23. <strong>J. Seo (Corresponding)<\/strong>, S.S.R.K.H. Vegi, S.V. Babu, Post-CMP Cleaning Solutions for the Removal of Organic Contaminants with Reduced Galvanic Corrosion at Copper\/Cobalt Interface for Advanced Cu Interconnect Applications, <strong><em>ECS Journal of Solid State Science and Technology,<\/em><\/strong> 2019, 8 (8), P379-P387.<\/p>\n\n\n\n<figure class=\"wp-block-image size-full is-resized is-style-default\"><img loading=\"lazy\" decoding=\"async\" width=\"510\" height=\"538\" src=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2840-Oct.-17-16.19.jpg\" alt=\"Graphic for &quot;Post-CMP Cleaning Solutions for the Removal of Organic Contaminants with Reduced Galvanic Corrosion at Copper\/Cobalt Interface for Advanced Cu Interconnect Applications.&quot; For more information please contact jseo@clarkson.edu\" class=\"wp-image-574\" style=\"width:464px;height:490px\" srcset=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2840-Oct.-17-16.19.jpg 510w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2840-Oct.-17-16.19-284x300.jpg 284w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2840-Oct.-17-16.19-256x270.jpg 256w\" sizes=\"auto, (max-width: 510px) 100vw, 510px\" \/><\/figure>\n\n\n\n<p>22. <strong>J. Seo<\/strong>, S.S.R.K.H. Vegi, C.K. Ranaweera, N.K. Baradanahalli, J. Han, D. Koli, S.V. Babu, Formation of Cobalt-BTA Complexes and Their Removal from Various Surfaces Relevant to Cobalt Interconnect Applications, <strong><em>ECS Journal of Solid State Science and Technology,<\/em><\/strong> 2019, 7 (5), P3009-P3017.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\" id=\"2018\">2018 <\/h3>\n\n\n\n<p>21. <strong>J. Seo<\/strong>, A. Gowda, S.V. Babu, Almost Complete Removal of Ceria Particles Down to 10 nm Size from Silicon Dioxide Surfaces, <strong><em>ECS Journal of Solid State Science and Technology,<\/em><\/strong> 2018, 7(5), P23-P252.<\/p>\n\n\n\n<figure class=\"wp-block-image size-full is-resized is-style-default\"><img loading=\"lazy\" decoding=\"async\" width=\"720\" height=\"606\" src=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2841-Oct.-17-16.23.jpg\" alt=\"Graphic for &quot;Almost Complete Removal of Ceria Particles Down to 10 nm Size from Silicon Dioxide Surfaces.&quot; For more information please contact jseo@clarkson.edu\" class=\"wp-image-575\" style=\"width:552px;height:466px\" srcset=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2841-Oct.-17-16.23.jpg 720w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2841-Oct.-17-16.23-300x253.jpg 300w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2841-Oct.-17-16.23-321x270.jpg 321w\" sizes=\"auto, (max-width: 720px) 100vw, 720px\" \/><\/figure>\n\n\n\n<p>20. C.K. Ranaweera, N.K. Baradanahalli, R. Popuri, <strong>J. Seo<\/strong>, S.V. Babu, Ammonium persulfate and potassium oleate containing silica dispersions for chemical mechanical polishing for cobalt interconnect applications,<strong><em> ECS Journal of Solid State Science and Technology,<\/em><\/strong><em> <\/em>2018, 7 (5), P1-P8.<\/p>\n\n\n\n<figure class=\"wp-block-image size-full is-resized is-style-default\"><img loading=\"lazy\" decoding=\"async\" width=\"664\" height=\"243\" src=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2843-Oct.-17-16.25.jpg\" alt=\"For more information please contact jseo@clarkson.edu\" class=\"wp-image-577\" style=\"width:566px;height:207px\" srcset=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2843-Oct.-17-16.25.jpg 664w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2843-Oct.-17-16.25-300x110.jpg 300w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2843-Oct.-17-16.25-360x132.jpg 360w\" sizes=\"auto, (max-width: 664px) 100vw, 664px\" \/><\/figure>\n\n\n\n<p>19. J. Choi*, J. Kim*, <strong>J. Seo<\/strong>, J. Kwon, T. Song, Environmentally-harmless Polylactic Acid-Polyethylene Glycol Binder for Deformable ceramic green body, <strong><em>Ceramics International,<\/em><\/strong> 2018, 44(4), 4220-4224. <span class=\"has-inline-color has-vivid-purple-color\"><strong>Front Cover<\/strong><\/span><\/p>\n\n\n\n<h3 class=\"wp-block-heading\" id=\"2014-2017-18-papers\">2014-2017 (18 papers)<\/h3>\n\n\n\n<p>18. J. Choi*, J. Kim*, <strong>J. Seo*<\/strong>, J. Kwon, T. Song, Toward functional 3D architecture platform: Advanced approach to anchor functional metal oxide onto 3D printed scaffold, <strong><em>Advanced Engineering Materials,<\/em><\/strong> 2017, 1700901. (Front Cover)<\/p>\n\n\n\n<p>17. K. You*, <strong>J. Seo*<\/strong>, T. Song, Control of Tungsten Protrusion with Surface Active Agent during Tungsten Chemical Mechanical Polishing,<strong><em> ECS Journal of Solid State Science and Technology,<\/em> <\/strong>2017, 6(12), P822-P827.<\/p>\n\n\n\n<figure class=\"wp-block-image size-full is-resized is-style-default\"><img loading=\"lazy\" decoding=\"async\" width=\"623\" height=\"649\" src=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2844-Oct.-17-16.27.jpg\" alt=\"For more information please contact jseo@clarkson.edu\" class=\"wp-image-578\" style=\"width:384px;height:400px\" srcset=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2844-Oct.-17-16.27.jpg 623w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2844-Oct.-17-16.27-288x300.jpg 288w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2844-Oct.-17-16.27-259x270.jpg 259w\" sizes=\"auto, (max-width: 623px) 100vw, 623px\" \/><\/figure>\n\n\n\n<p>16. <strong>J. Seo<\/strong>, K. You, J. Moon, J. Kim, U. Paik, Corrosion Behavior of Tungsten Metal Gate in the Presence of Hydrogen Peroxide at Acidic Medium, <strong><em>ECS Journal of Solid State Science and Technology,<\/em> <\/strong>2017, 6(4), P169-P171.<\/p>\n\n\n\n<figure class=\"wp-block-image size-full is-resized is-style-default\"><img loading=\"lazy\" decoding=\"async\" width=\"650\" height=\"342\" src=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2851-Oct.-17-16.39.jpg\" alt=\"For more information please contact jseo@clarkson.edu\" class=\"wp-image-589\" style=\"width:382px;height:201px\" srcset=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2851-Oct.-17-16.39.jpg 650w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2851-Oct.-17-16.39-300x158.jpg 300w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2851-Oct.-17-16.39-360x189.jpg 360w\" sizes=\"auto, (max-width: 650px) 100vw, 650px\" \/><\/figure>\n\n\n\n<p>15. <strong>J. Seo<\/strong>, J. Kim, M. Lee, K. You, J. Moon, D. Lee, U. Paik, Multi-objective optimization of tungsten CMP slurry for advanced semiconductor manufacturing using a response surface methodology, <strong><em>Materials &amp; Design,<\/em><\/strong><em> <\/em>2017,117, 131-138.<\/p>\n\n\n\n<figure class=\"wp-block-image size-large is-resized is-style-default\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"643\" src=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/\uadf8\ub9bc1-1024x643.png\" alt=\"For more information please contact jseo@clarkson.edu\" class=\"wp-image-579\" style=\"width:388px;height:243px\" srcset=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/\uadf8\ub9bc1-1024x643.png 1024w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/\uadf8\ub9bc1-300x188.png 300w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/\uadf8\ub9bc1-768x482.png 768w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/\uadf8\ub9bc1-360x226.png 360w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/\uadf8\ub9bc1.png 1129w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/figure>\n\n\n\n<p>14. <strong>J. Seo<\/strong>*, J. Moon*, Y. Kim, K. Kim, K. Lee, Y. Cho, D. Lee, U. Paik, Synergistic Effect of Mixed Particle Size on W CMP Process: Optimization using Experimental Design, <strong><em>ECS Journal of Solid State Science and Technology,<\/em><\/strong><em> <\/em>2017, 6(1), P42-P44.<\/p>\n\n\n\n<figure class=\"wp-block-image size-full is-resized is-style-default\"><img loading=\"lazy\" decoding=\"async\" width=\"918\" height=\"594\" src=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2847-Oct.-17-16.30.jpg\" alt=\"For more information please contact jseo@clarkson.edu\" class=\"wp-image-580\" style=\"width:384px;height:248px\" srcset=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2847-Oct.-17-16.30.jpg 918w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2847-Oct.-17-16.30-300x194.jpg 300w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2847-Oct.-17-16.30-768x497.jpg 768w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2847-Oct.-17-16.30-360x233.jpg 360w\" sizes=\"auto, (max-width: 918px) 100vw, 918px\" \/><\/figure>\n\n\n\n<p>13. K. Kim*, K. Lee*, <strong>J. Seo<\/strong>, T. Song, Reduction of friction force between ceria and SiO<sub>2<\/sub> for low dishing in STI CMP,<strong><em> ECS Journal of Solid State Science and Technology,<\/em> <\/strong>2017, 6 (10), P752-P754.<\/p>\n\n\n\n<figure class=\"wp-block-image size-full is-resized is-style-default\"><img loading=\"lazy\" decoding=\"async\" width=\"959\" height=\"566\" src=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2848-Oct.-17-16.31.jpg\" alt=\"For more information please contact jseo@clarkson.edu\" class=\"wp-image-581\" style=\"width:371px;height:218px\" srcset=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2848-Oct.-17-16.31.jpg 959w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2848-Oct.-17-16.31-300x177.jpg 300w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2848-Oct.-17-16.31-768x453.jpg 768w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2848-Oct.-17-16.31-360x212.jpg 360w\" sizes=\"auto, (max-width: 959px) 100vw, 959px\" \/><\/figure>\n\n\n\n<p>12. K. Kim, <strong>J. Seo, <\/strong>M. Lee, J. Moon, K. Lee, D. Yi, and U. Paik, Highly dispersed Fe<sup>3+<\/sup>-substituted colloidal silica nanoparticles for defect-free tungsten chemical mechanical planarization, <strong><em>ECS Journal of Solid State Science and Technology,<\/em><\/strong> 2017, 6 (7), P405-P409.<\/p>\n\n\n\n<figure class=\"wp-block-image size-full is-resized is-style-default\"><img loading=\"lazy\" decoding=\"async\" width=\"635\" height=\"393\" src=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2849-Oct.-17-16.32.jpg\" alt=\"For more information please contact jseo@clarkson.edu\" class=\"wp-image-582\" style=\"width:381px;height:236px\" srcset=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2849-Oct.-17-16.32.jpg 635w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2849-Oct.-17-16.32-300x186.jpg 300w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2849-Oct.-17-16.32-360x223.jpg 360w\" sizes=\"auto, (max-width: 635px) 100vw, 635px\" \/><\/figure>\n\n\n\n<p>11. K. Kim, <strong>J. Seo, <\/strong>M. Lee, J. Moon, K. Lee, D. Yi, and U. Paik, Ce<sup>3+<\/sup> enriched core-shell ceria nanoparticle for silicate adsorption,<strong><em> Journal of Materials Research,<\/em><\/strong> 2017, 32 (14), P2829-2836.<\/p>\n\n\n\n<figure class=\"wp-block-image size-full is-resized is-style-default\"><img loading=\"lazy\" decoding=\"async\" width=\"586\" height=\"810\" src=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2850-Oct.-17-16.33.jpg\" alt=\"For more information please contact jseo@clarkson.edu\" class=\"wp-image-583\" style=\"width:394px;height:544px\" srcset=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2850-Oct.-17-16.33.jpg 586w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2850-Oct.-17-16.33-217x300.jpg 217w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/ScreenHunter_2850-Oct.-17-16.33-195x270.jpg 195w\" sizes=\"auto, (max-width: 586px) 100vw, 586px\" \/><\/figure>\n\n\n\n<p>10. J. Kim, <strong>J. Seo, <\/strong>K. Fu, J. Choi, J. Kwon, L. Hu, U. Paik, Synergistic&nbsp;Protective&nbsp;Effect&nbsp;of&nbsp;a&nbsp;BN-Carbon-separator&nbsp;for&nbsp;Highly&nbsp;Stable&nbsp;Lithium&nbsp;Sulfur&nbsp;Batteries, <strong><em>NPG Asia Materials,<\/em><\/strong> 2017, 9 (4), e375.<\/p>\n\n\n\n<p>9. <strong>J. Seo<\/strong>, J. Kim, M. Lee, D. Yi, U. Paik, Size dependent interactions of silica nanoparticles with flat silica surface, <strong><em>Journal of Colloid and Interface Science<\/em><\/strong>, 2016, 483, 177-184.<\/p>\n\n\n\n<figure class=\"wp-block-image size-full is-resized is-style-default\"><img loading=\"lazy\" decoding=\"async\" width=\"774\" height=\"531\" src=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/1-s2.0-S0021979716305963-fx1_lrg.jpg\" alt=\"For more information please contact jseo@clarkson.edu\" class=\"wp-image-584\" style=\"width:464px;height:318px\" srcset=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/1-s2.0-S0021979716305963-fx1_lrg.jpg 774w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/1-s2.0-S0021979716305963-fx1_lrg-300x206.jpg 300w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/1-s2.0-S0021979716305963-fx1_lrg-768x527.jpg 768w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/1-s2.0-S0021979716305963-fx1_lrg-360x247.jpg 360w\" sizes=\"auto, (max-width: 774px) 100vw, 774px\" \/><\/figure>\n\n\n\n<p>8. <strong>J. Seo<\/strong>*, J. Moon*, J. Kim, K. Lee, J. Hwang, H. Yoon, D. Yi, U. Paik, Role of oxidation state of cerium on the ceria surfaces for silicate adsorption, <strong><em>Applied Surface Science<\/em><\/strong>, 2016, 389, 311-315.<\/p>\n\n\n\n<figure class=\"wp-block-image size-large is-resized is-style-default\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"410\" src=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/1-s2.0-S0169433216314222-fx1_lrg-1024x410.jpg\" alt=\"For more information please contact jseo@clarkson.edu\" class=\"wp-image-585\" style=\"width:632px;height:252px\" srcset=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/1-s2.0-S0169433216314222-fx1_lrg-1024x410.jpg 1024w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/1-s2.0-S0169433216314222-fx1_lrg-300x120.jpg 300w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/1-s2.0-S0169433216314222-fx1_lrg-768x307.jpg 768w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/1-s2.0-S0169433216314222-fx1_lrg-1536x615.jpg 1536w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/1-s2.0-S0169433216314222-fx1_lrg-2048x820.jpg 2048w, https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/1-s2.0-S0169433216314222-fx1_lrg-360x144.jpg 360w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/figure>\n\n\n\n<p>7. <strong>J. Seo<\/strong>, D. Lee, K. Lee, K. Kim, K. Kim, Optimizing a blend of mixture slurry in chemical&nbsp;mechanical&nbsp;planarization&nbsp;for&nbsp;advanced&nbsp;semiconductor&nbsp;manufacturing&nbsp;using&nbsp;a posterior preference articulation approach to dual response surface optimization, <strong><em>Applied Stochastic Models in Business and Industry<\/em><\/strong>, 2016, 32, 648-659.<\/p>\n\n\n\n<p>6. J. Kim, <strong>J. Seo, <\/strong>J. Choi, D. Shin, M. Carter, Y. Jeon, C. Wang, L. Hu, U. Paik, Synergistic Ultra-thin Functional Polymer Coated Carbon Nanotube Interlayer for High performance Lithium Sulfur Batteries, <strong><em>ACS Applied Materials and Interfaces<\/em><\/strong>, 2016, 8, 20092-20099.<\/p>\n\n\n\n<p>5. J. Kim, J. Choi, <strong>J. Seo, <\/strong>J. Kwon, U. Paik, Two-dimensional Nafion nanoweb anion-shield for improved electrochemical performances of lithium-sulfur batteries, <strong><em>Journal of Materials Chemistry A<\/em><\/strong>, 2016, 4, 11203-11206.<\/p>\n\n\n\n<p>4. <strong>J. Seo<\/strong>, J. Moon, S. Moon, U. Paik, Interpolymer complexes of poly (acrylic acid) and poly (ethylene glycol) for low dishing in STI CMP, <strong><em>Applied Surface Science<\/em><\/strong>, 2015, 353, 499-503.<\/p>\n\n\n\n<figure class=\"wp-block-image size-full is-style-default\"><img loading=\"lazy\" decoding=\"async\" width=\"282\" height=\"200\" src=\"https:\/\/sites.clarkson.edu\/jseo\/wp-content\/uploads\/sites\/55\/2021\/10\/1-s2.0-S0169433215014221-fx1.jpg\" alt=\"For more information please contact jseo@clarkson.edu\" class=\"wp-image-586\"\/><\/figure>\n\n\n\n<p>3. <strong>J. Seo<\/strong>*, J. Lee*, J. Moon, W. Sigmund, U. Paik, Role of the surface chemistry of ceria surfaces on silicate adsorption, <strong><em>ACS Applied Materials and Interfaces<\/em><\/strong>, 2014, 6, 7388-7394.<\/p>\n\n\n\n<p>2. <strong>J. Seo<\/strong>*, J. Moon*, J. Bae, K. Yoon, W. Sigmund, U. Paik, Control of adhesion force between ceria particles and polishing pad in shallow trench isolation chemical mechanical planarization, <strong><em>Journal of Nanoscience and Nanotechnology<\/em><\/strong>, 2014, 14, 4351-4356.<\/p>\n\n\n\n<p>1. <strong>J. Seo<\/strong>*, K. Yoon*, J. Moon, K. Kim, W. Sigmund, U. Paik, Effects of physico-chemical properties between poly(ethyleneimine) and silica abrasive on copper chemical mechanical planarization, <strong><em>Microelectronic Engineering<\/em><\/strong>, 2014, 113, 50-54.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\" id=\"book-chapters-invited\">Book Chapters (Invited)<\/h2>\n\n\n\n<ol style=\"list-style-type:1\" class=\"wp-block-list\">\n<li><strong>J. Seo,<\/strong> Chapter 18. Challenges and solutions for post-CMP cleaning at device and interconnect levels, <em>in Advances in Chemical Mechanical Planarization (CMP)<\/em> 2nd edition, edited by S.V. Babu (2021).<\/li>\n\n\n\n<li>K. Lee, <strong>J. Seo,<\/strong> U Paik, Chapter 11. Preparation and characterization of slurry for CMP, <em>in Advances in Chemical Mechanical Planarization (CMP)<\/em> 2nd edition, edited by S.V. Babu (2021).<\/li>\n\n\n\n<li><strong>J. Seo, <\/strong>CMP-related to contaminants: their source and characterization, <em>in Emerging Contaminants,<\/em> edited by Aurel Nuro (2020)<\/li>\n\n\n\n<li><strong>J. Seo,<\/strong> U Paik, Preparation and characterization of slurry for CMP, Chapter 11 <em>in Advances in Chemical Mechanical Planarization (CMP)<\/em>, edited by Prof. S.V. Babu (2016).<\/li>\n<\/ol>\n\n\n\n<h2 class=\"wp-block-heading\" id=\"patents\">Patents<\/h2>\n\n\n\n<ol style=\"list-style-type:1\" class=\"wp-block-list\">\n<li>Post-CMP cleaning composition, Japan, PCT\/JP2022\/026835 (Pending, 2022\/07\/06)<\/li>\n\n\n\n<li>Post-CMP cleaning composition, Japan, JP2023009994A (Pending, 2023\/01\/20)<\/li>\n\n\n\n<li>Post-CMP cleaning composition, Japan, JP2023009993A (Pending, 2023\/01\/20)<\/li>\n\n\n\n<li>High removal rate oxide film polishing slurry composition, Republic of Korea, 10-2021-0050246 (<strong><em>Granted<\/em><\/strong>, 2021\/07\/14).<\/li>\n\n\n\n<li>Abrasive particle of core-shell structure, preparing method of the same and polishing slurry composition comprising the same, Republic of Korea, 10-2019-0134621 (Pending, 2019\/10\/28).<\/li>\n\n\n\n<li>Polishing slurry composition, China, CN106661429B (<strong><em>Granted,<\/em><\/strong> 2019\/07\/05).<\/li>\n\n\n\n<li>Polishing slurry composition, Taiwan, TWI658133B (<strong><em>Granted,<\/em><\/strong> 2019\/05\/01).<\/li>\n\n\n\n<li>Slurry composition for chemical mechanical polishing, method of preparing the same, and polishing method using the same, USA, 15\/293,816 (<strong><em>Granted,<\/em><\/strong> 2018\/08\/14).<\/li>\n\n\n\n<li>Slurry comprising for STI polishing, Republic of Korea, 1017617920000 (<strong><em>Granted,<\/em><\/strong> 2017\/07\/20).<\/li>\n\n\n\n<li>Polishing slurry composition, USA, US20170183537A1 (Pending, 2017\/06\/29).<\/li>\n\n\n\n<li>Slurry composition for chemical mechanical polishing, method of preparing the same, and polishing method using the same, Republic of Korea, 10-2017-0044522 (Pending, 2017\/04\/25).<\/li>\n\n\n\n<li>Polishing slurry composition, Republic of Korea, 1016820970000 (<strong><em>Granted,<\/em><\/strong> 2016\/11\/28).<\/li>\n\n\n\n<li>Slurry composition for chemical mechanical polishing, method of preparing the same, and polishing method using the same, China, CN106867411A (Pending, 2016\/10\/17).<\/li>\n\n\n\n<li>Polishing slurry composition, Republic of Korea, 1016603840000 (<strong><em>Granted,<\/em><\/strong> 2016\/09\/21).<\/li>\n\n\n\n<li>Porous polishing particle and slurry comprising the same, Republic of Korea, 1016558490000 (<em>Granted<\/em>, 2016\/09\/02).<\/li>\n\n\n\n<li>Nano ceria slurry composition for chemical-mechanical polishing and preparation method for thereof, Republic of Korea, 1016133590000 (<strong><em>Granted,<\/em><\/strong> 2016\/04\/11).<\/li>\n\n\n\n<li>Polishing slurry and substrate or wafer polishing method using the same, Republic of Korea, 1014067590000 (<strong><em>Granted,<\/em><\/strong> 2014\/06\/05).<\/li>\n\n\n\n<li>Polishing slurry and substrate or wafer polishing method using the same, Republic of Korea, 1014067600000 (<strong><em>Granted,<\/em><\/strong> 2014\/06\/05).<\/li>\n\n\n\n<li>Slurry composition and substrate or wafer polishing method using the same, Republic of Korea, 1014067570000 (<strong><em>Granted,<\/em><\/strong> 2014\/06\/05).<\/li>\n\n\n\n<li>Slurry composition and substrate or wafer polishing method using the same, Republic of Korea, 1014067580000 (<strong><em>Granted,<\/em><\/strong> 2014\/06\/05).<\/li>\n\n\n\n<li>Polishing slurry composition and substrate or wafer polishing method using the same, Republic of Korea, 1013881060000 (<strong><em>Granted,<\/em><\/strong> 2014\/04\/22).<\/li>\n\n\n\n<li>Polishing slurry for removal of initial step height and substrate or wafer polishing method using the same, Republic of Korea, 1013962520000 (<strong><em>Granted,<\/em><\/strong> 2014\/05\/12).<\/li>\n\n\n\n<li>Polishing slurry additive composition and slurry composition including the polishing slurry additive composition, Republic of Korea, 1020130134737 (<strong><em>Granted,<\/em><\/strong> 2013\/11\/07).<\/li>\n\n\n\n<li>Catalyst slurry, electrode prepared by using the catalyst slurry and fuel cell including the electrode, USA, US 8,512,905 (<strong><em>Granted,<\/em><\/strong> 2013\/08\/20).<\/li>\n<\/ol>\n\n\n\n<p><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Peer-reviewed Publications (62 papers, 4 book chapters, 24 patents) Submitted 65. S. Ryu, C. Larson, P.J. Kim, J. Choi, K. Lee*, and\u00a0J. Seo* Mechanism of Surface Passivation by Sulfur-Containing Amino Acids in Corrosion Inhibition of Molybdenum in Chemical Mechanical Planarization,\u00a0Submitted. 64. A. Khanmohammadi*, G. Ahmadi, S. Krishnan, A. Sadrimofakham, R. Muralidaran, C. Lim, D. Kwon, [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"advgb_blocks_editor_width":"","advgb_blocks_columns_visual_guide":"","footnotes":""},"class_list":["post-10","page","type-page","status-publish","hentry"],"coauthors":[],"author_meta":{"author_link":"https:\/\/sites.clarkson.edu\/jseo\/author\/moeler\/","display_name":"moeler"},"relative_dates":{"created":"Posted 5 years ago","modified":"Updated 7 months ago"},"absolute_dates":{"created":"Posted on May 28, 2021","modified":"Updated on September 17, 2025"},"absolute_dates_time":{"created":"Posted on May 28, 2021 12:13 pm","modified":"Updated on September 17, 2025 2:43 pm"},"featured_img_caption":"","featured_img":false,"series_order":"","_links":{"self":[{"href":"https:\/\/sites.clarkson.edu\/jseo\/wp-json\/wp\/v2\/pages\/10","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/sites.clarkson.edu\/jseo\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/sites.clarkson.edu\/jseo\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/sites.clarkson.edu\/jseo\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/sites.clarkson.edu\/jseo\/wp-json\/wp\/v2\/comments?post=10"}],"version-history":[{"count":24,"href":"https:\/\/sites.clarkson.edu\/jseo\/wp-json\/wp\/v2\/pages\/10\/revisions"}],"predecessor-version":[{"id":1924,"href":"https:\/\/sites.clarkson.edu\/jseo\/wp-json\/wp\/v2\/pages\/10\/revisions\/1924"}],"wp:attachment":[{"href":"https:\/\/sites.clarkson.edu\/jseo\/wp-json\/wp\/v2\/media?parent=10"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}