{"id":483,"date":"2022-11-21T15:34:17","date_gmt":"2022-11-21T15:34:17","guid":{"rendered":"https:\/\/dev-cu-sites.pantheonsite.io\/camp\/?page_id=483"},"modified":"2023-08-02T12:34:11","modified_gmt":"2023-08-02T12:34:11","slug":"25th-international-symposium-on-cmp","status":"publish","type":"page","link":"https:\/\/sites.clarkson.edu\/camp\/25th-international-symposium-on-cmp\/","title":{"rendered":"25th International Symposium on CMP"},"content":{"rendered":"<h2>CAMP is excited to host the 25th International Symposium on Chemical-Mechanical Planarization (CMP)<\/p>\n<p>August 6 &#8211; 9, 2023 in Lake Placid, NY<\/h2>\n<p>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img decoding=\"async\" width=\"640\" height=\"226\" src=\"https:\/\/sites.clarkson.edu\/camp\/wp-content\/uploads\/sites\/49\/2023\/03\/HighPeaksResortImage-1024x362.jpg\" alt=\"\" loading=\"lazy\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/p>\n<p><strong>Chemical-mechanical planarization (CMP)\u00a0<\/strong>has come to occupy a central role in many industrially important technologies, especially in semiconductor manufacturing.\u00a0The <b><i>25th International Symposium on CMP<\/i><\/b>, hosted by <b>Clarkson University\u2019s Center for Advanced Materials Processing (CAMP)<\/b>, is the leading forum to\u00a0hear leading-edge ideas and technologies relating to CMP along with ample time to network with colleagues in the CMP field.<\/p>\n<p>The meeting will again be held in picturesque Lake Placid, New York, in the\u00a0High Peaks\u00a0Resort Hotel.\u00a0<\/p>\n<p>Hotel and travel information can be found further below.\u00a0<\/p>\n<p>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img decoding=\"async\" width=\"460\" height=\"260\" src=\"https:\/\/sites.clarkson.edu\/camp\/wp-content\/uploads\/sites\/49\/2022\/06\/AdkPic_Fall.png\" alt=\"\" loading=\"lazy\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/p>\n<h3><b>Schedule Announced!\u00a0<\/b><\/h3>\n<p><b>We are pleased to announce the\u00a0schedule of talks &#8211; see below\u00a0<\/b>(updated 8\/2\/2023).<\/p>\n<p style=\"font-weight: 400\"><strong><u>SUNDAY, AUGUST 6<\/u><\/strong><\/p>\n<p style=\"font-weight: 400\">1:00 pm \u2013 5:00 pm\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 Registration &amp; Hotel Check-In (<em>Hotel Lobby<\/em>)<\/p>\n<p style=\"font-weight: 400\">5:00 pm \u2013 6:00 pm\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 Welcome Reception (<em>Sentinel Range<\/em>)<\/p>\n<p style=\"font-weight: 400\"><strong><u>MONDAY, AUGUST 7<\/u><\/strong> \u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 All presentations will be held in <em>McIntyre Range<\/em><\/p>\n<p style=\"font-weight: 400\">7:00 am \u2013 8:00 am\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Breakfast (Great Range)<\/em><\/p>\n<p style=\"font-weight: 400\"><strong>SESSION A: \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 <\/strong>Chair: <strong>Bob Roberts<\/strong> (X-trinSiC)<\/p>\n<p style=\"font-weight: 400\">8:00 am \u2013 8:10 am\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Opening Remarks<\/em> <strong>Devon A. Shipp<\/strong>, Clarkson University<\/p>\n<p style=\"font-weight: 400\">8:10 am \u2013 9:00 am\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <strong>Plenary:<\/strong> <em>CMP Challenges and Equipment Solutions for FEOL Applications, <\/em><strong>Katrina Mikhaylichenko<\/strong>, Applied Materials<\/p>\n<p style=\"font-weight: 400\">9:00 am \u2013 9:25 am\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>CMP Opportunities for Emerging Semiconductor Technologies, <\/em><strong>Thomas Hoff<\/strong>, Intel Corporation<\/p>\n<p style=\"font-weight: 400\">9:25 am \u2013 9:50 am\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Nodule Deformation and Contact Path of PVA Roller Brushes on a Rotating Plate, <\/em><strong>Toshiyuki Sanada<\/strong>, Shizuoka University<\/p>\n<p style=\"font-weight: 400\">9:50 am \u2013 10:15 am\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Break<\/em> (25 min)<\/p>\n<p style=\"font-weight: 400\"><strong>SESSION B:\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <\/strong>Chair: <strong>Thomas Hoff<\/strong> (Intel)<\/p>\n<p style=\"font-weight: 400\">10:15 am \u2013 10:40 am\u00a0\u00a0\u00a0\u00a0 <em>Characterization of PVA Brush in Post-CMP Cleaning for 10nm Below Metal CMP Process<\/em>, <strong>Jingoo Park<\/strong>, Hanyang University<\/p>\n<p style=\"font-weight: 400\">10:40 am \u2013 11:05 am\u00a0\u00a0\u00a0\u00a0 <em>Corrosion Management and Cleaning of Very Small Features Following CMP of Advanced Logic Devices, <\/em><strong>Paul Bernatis<\/strong>, DuPont<\/p>\n<p style=\"font-weight: 400\">11:05 am \u2013 11:20 am\u00a0\u00a0\u00a0 <i>United States <\/i><i>CMP Users Group: User Group Activities and Program Status<\/i><em>, <\/em><strong>Bob Roberts<\/strong>, Chair &#8211; United States CMP Users Group<\/p>\n<p style=\"font-weight: 400\">11:20 am \u2013 12:00 pm\u00a0\u00a0\u00a0\u00a0 <em>Poster Pitches<\/em>, Various<\/p>\n<p style=\"font-weight: 400\">12:00 pm \u2013 1:30 pm\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Lunch (Great Range)<\/em><\/p>\n<p style=\"font-weight: 400\">1:30 pm \u2013 4:00 pm\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Open Time<\/em><\/p>\n<p style=\"font-weight: 400\"><strong>SESSION C:\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <\/strong>Chair: <strong>Tricia Burroughs<\/strong> (GlobalFoundries)<\/p>\n<p style=\"font-weight: 400\">4:00 pm \u2013 4:25 pm\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Advanced in W CMP Slurries for High Rate and Low Corrosion<\/em>, <strong>Na Zhang<\/strong>, Entegris<\/p>\n<p style=\"font-weight: 400\">4:25 pm \u2013 4:50 pm\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>The \u201cPER\u201d-fect Storm: Exploring Complex-Assisted Redox Chemistries for Enhanced SiC CMP Performance<\/em>, <strong>Jason Keleher<\/strong>, Lewis University<\/p>\n<p style=\"font-weight: 400\">4:50 pm \u2013 5:15 pm\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Cu CMP Center Residue Relationship to Pad Groove Design and Head Oscillation<\/em>,<strong>Eric Egan<\/strong>, GlobalFoundries<\/p>\n<p style=\"font-weight: 400\">5:15 pm \u2013 5:40 pm\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Poster Pitches<\/em>, Various<\/p>\n<p style=\"font-weight: 400\">5:40 pm \u2013 7:00 pm\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Poster Session and Reception (Sentinel Range)<\/em><\/p>\n<p style=\"font-weight: 400\">7:00 pm \u2013 9:00 pm\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <strong>2023 International CMP Symposium: Dinner &amp; Keynote Address <\/strong>(<em>Great<\/em> <em>Range<\/em>)<\/p>\n<p style=\"font-weight: 400\"><strong>Andy Carswell<\/strong>, Director of DRAM CMP at Micron, <em>The \u201cBond\u201d Between Advanced Memory and CMP has Never Been Stronger \u2013 CMP will Enable the Memory Roadmap<\/em>. Introduced by <strong>Marc P. Christensen <\/strong>(President, Clarkson University)<\/p>\n<p style=\"font-weight: 400\"><strong><u>TUESDAY, AUGUST 8<\/u><\/strong><\/p>\n<p style=\"font-weight: 400\">7:00 am \u2013 8:30 am\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Breakfast Buffet (Great Range)<\/em><\/p>\n<p style=\"font-weight: 400\"><strong>SESSION D:\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <\/strong>Chair: <strong>Hirokuni Hiyama<\/strong> (Ebara)<\/p>\n<p style=\"font-weight: 400\">8:10 am \u2013 9:00 am\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <strong>Plenary:<\/strong> <em>An Overview of Advanced Process Control Solutions for CMP, <\/em><strong>Jun Qian<\/strong>, Applied Materials<\/p>\n<p style=\"font-weight: 400\">9:00 am \u2013 9:25 am\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Slurry Activation for Enhanced Surface Redox Reactions in CMP<\/em>, <strong>Ara Philipossian<\/strong>, Araca, Inc.<\/p>\n<p style=\"font-weight: 400\">9:25 am \u2013 9:50 am\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Moving Sub-100 nm Particle on Surface Observatory in Wet Process by Evanescent Wave<\/em>, <strong>Panart Khajornrungruang<\/strong>, Kyushu Institute of Technology<\/p>\n<p style=\"font-weight: 400\">9:50 am \u2013 10:15 am\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Break<\/em> (25 min)<\/p>\n<p style=\"font-weight: 400\"><strong>SESSION E:\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <\/strong>Chair: <strong>Julia Kozhukh<\/strong> (DuPont)<\/p>\n<p style=\"font-weight: 400\">10:15 am \u2013 10:40 am\u00a0\u00a0\u00a0\u00a0 <em>Environmentally Friendly Amino Acid-based CMP Slurry for Cu and Co<\/em>, <strong>Elizabeth Podlaha-Murphy<\/strong>, Clarkson University<\/p>\n<p style=\"font-weight: 400\">10:40 am \u2013 11:05 am\u00a0\u00a0\u00a0\u00a0 <em>AFM Study on the Hydration of PVA Brush Surface and its Impact on the Interaction with Abrasive Nanoparticle<\/em>, <strong>Takeshi Fukuma<\/strong>, Kanazawa University<\/p>\n<p style=\"font-weight: 400\">11:05 am \u2013 11:30 am\u00a0\u00a0\u00a0\u00a0 <em>Challenges with Utilizing Sonic Energy for post CMP Cleaning Applications<\/em>, <strong>Timothy Thao<\/strong>, Applied Materials<\/p>\n<p style=\"font-weight: 400\">11:30 am \u2013 11:55 am\u00a0\u00a0\u00a0\u00a0 <em>Design and Manufacturing Strategies for Scratch-less Pads in Chemical-Mechanical Polishing<\/em>, <strong>Sa<\/strong><strong>nha Kim<\/strong>, KAIST<\/p>\n<p style=\"font-weight: 400\">12:00 pm \u2013 1:30 pm\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Lunch (Great Range)<\/em><\/p>\n<p style=\"font-weight: 400\">1:30 pm \u2013 4:00 pm\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Open Time<\/em><\/p>\n<p style=\"font-weight: 400\">2:00 pm \u2013 4:00 pm \u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Mentoring Workshop, <\/em>Led by <em><strong>Tricia Burroughs<\/strong> (GlobalFoundries)<\/em> (<em>Great Range<\/em>)<\/p>\n<p style=\"font-weight: 400\"><strong>SESSION F:\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <\/strong>Chair: <strong>Taesung Kim<\/strong> (Sungkyunkwan University)<\/p>\n<p style=\"font-weight: 400\">4:00 pm \u2013 4:25 pm\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>W Post CMP Clean Performance with Advanced Formulations<\/em>, <strong>Wei-Tsu Tseng<\/strong>, IBM<\/p>\n<p style=\"font-weight: 400\">4:25 pm \u2013 4:50 pm\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Slurry PSD\u2019s and LPC\u2019s: Why Do They Matter?<\/em>, <strong>Robert Rhoades<\/strong>, X-trinSiC<\/p>\n<p style=\"font-weight: 400\">4:50 pm \u2013 5:15 pm\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>CMP Challengess in Imager and Micro Display Fabrication<\/em>, <strong>Knut Gottfried<\/strong>, Fraunhofer ENAS<\/p>\n<p style=\"font-weight: 400\">5:15 pm \u2013 5:40 pm\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0<i>CMP Sustainability Practices for Water Conservation in a High Volume Manufacturing Environment<\/i>, <strong>Elizabeth Anderson<\/strong>, Analog Devices<\/p>\n<p style=\"font-weight: 400\">5:40 pm \u2013 6:30 pm\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Reception (Sentinel Range)<\/em><\/p>\n<p style=\"font-weight: 400\">6:30 pm \u2013 8:30 pm\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <strong>2023 International CMP Symposium: Dinner &amp; Keynote Address <\/strong><em>(Great Range)<\/em><\/p>\n<p style=\"font-weight: 400\"><strong>Hoyoung Kim<\/strong>, Master, Process Development, Semiconductor R&amp;D Center, Samsung Electronics, <em>CMP at 40: Beyond the Hype, Challenges and Opportunities for the Next 10 Years<\/em>. Introduced by <strong>Bill Jemison<\/strong> (Dean, Coulter School of Engineering, Clarkson University.<\/p>\n<p style=\"font-weight: 400\"><strong><u>WEDNESDAY, AUGUST 9<\/u><\/strong><\/p>\n<p style=\"font-weight: 400\">7:00 am \u2013 8:30 am\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Breakfast Buffet<\/em><\/p>\n<p style=\"font-weight: 400\"><strong>SESSION G:\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <\/strong>Chair: <strong>Bradley Wood<\/strong> (Entegris)<\/p>\n<p style=\"font-weight: 400\">8:10 am \u2013 8:35 am\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Planarization Technology above Chemical Mechanical Polishing, <\/em><strong>JiChul Yang<\/strong>, Ebara<\/p>\n<p style=\"font-weight: 400\">8:35 am \u2013 9:00 am\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Abrasive Size Distribution Control of CMP Slurry by Using Tangential Flow Filtration<\/em>,<strong>Taesung Kim<\/strong>, Sungkyunkwan University<\/p>\n<p style=\"font-weight: 400\">9:00 am \u2013 9:25 am\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Modern Nanoparticle Characterization Tools for CMP, <\/em><strong>Jeffrey Bodycomb<\/strong>, HORIBA Instruments Inc.<\/p>\n<p style=\"font-weight: 400\">9:25 am \u2013 9:50 am\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>CMP Removal Rate Scaling using the Shear Force Law How to Change the Removal Rate Without Affecting Friction and vice versa<\/em>, <strong>Leonard Borucki<\/strong>, Araca, Inc.<\/p>\n<p style=\"font-weight: 400\">9:50 am \u2013 10:15 am\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <em>Break<\/em> (25 min)<\/p>\n<p style=\"font-weight: 400\"><strong>SESSION H:\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <\/strong>Chair: <strong>Jihoon Seo<\/strong> (Clarkson University)<\/p>\n<p style=\"font-weight: 400\">10:15 am \u2013 10:40 am\u00a0\u00a0\u00a0\u00a0 <em>Thickness Profile <\/em><em>Verification on the Time Dependency in FEOL CMP<\/em>, <strong>Seungmahn Lee<\/strong>, Samsung Electronics<\/p>\n<p style=\"font-weight: 400\">10:40 am \u2013 11:05 am\u00a0\u00a0\u00a0\u00a0 <em>Biased Pulse Groove: Efforts Towards Sustainability<\/em>, <strong>Jin Kim<\/strong>, DuPont<\/p>\n<p style=\"font-weight: 400\">11:05 am \u2013 11:30 am\u00a0\u00a0\u00a0\u00a0 <em>Design of Carbon-Based Electrodes for Cu Removal and Recovery from CMP Slurries<\/em>, <strong>James Landon<\/strong>, ElectraMet<\/p>\n<p style=\"font-weight: 400\">11:30 am \u2013 11:55 am\u00a0\u00a0\u00a0\u00a0 <em>SiC vs. Silicon CMP<\/em>, <strong>Ian Currier<\/strong>, X-trinSiC<\/p>\n<p style=\"font-weight: 400\">11:55 am \u2013 12:00 pm\u00a0\u00a0\u00a0\u00a0 Closing Remarks, <strong>Devon A. Shipp<\/strong>, Clarkson University<\/p>\n<p style=\"font-weight: 400\">12:00 pm \u2013 1:30 pm\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <strong>Lunch <\/strong><em>(Great Range) <\/em><strong>&amp; Depart<\/strong><\/p>\n<h3>Registration &amp; Accommodation Information<\/h3>\n<p><b>Registration is now CLOSED.<\/b><b>Check-in time is 4pm or after.<\/b>Registration will include 3 breakfasts, 3 lunches, reception food, snacks during breaks, and dinners on Monday and Tuesday nights.\u00a0Our block-booking for <strong>accommodation<\/strong>\u00a0at the <b>High Peaks Resort <\/b>is now <b>closed. <\/b>For those who used CAMP&#8217;s block-booking: accommodation will be\u00a0paid separately directly to the hotel.<br \/>For those who have not made accommodation arrangements: there are several hotels in Lake Placid that you can make reservations at separately.\u00a0\u00a0<strong>FYI: the High Peaks Resort can be reached directly at +1-518-523-4411<\/strong>.You can check out the hotel amenities by visiting their website:\u00a0<a href=\"https:\/\/www.highpeaksresort.com\" target=\"_blank\" rel=\"noopener\">https:\/\/www.highpeaksresort.com<\/a>\u00a0<\/p>\n<p>A completed tax-exempt form must be presented for tax-exempt status.<\/p>\n<h3>How to get to Lake Placid?<\/h3>\n<p>The following website has information on how to get to Lake Placid:<\/p>\n<p>(<a style=\"font-family: var( --e-global-typography-text-font-family ), Sans-serif\" href=\"https:\/\/www.lakeplacid.com\/explore\/getting-here\">https:\/\/www.lakeplacid.com\/explore\/getting-here<\/a>)<\/p>\n<p>While there is a small regional\u00a0airport close by that has flights to\/from Boston,\u00a0planes are small and can be bumpy \ud83d\ude41\u00a0<\/p>\n<p>The closest international airport is Albany NY (the NY State capitol). If you choose to fly into Albany, rent a car and\u00a0then enjoy the 2.5 hour\u00a0drive\u00a0through\u00a0the picturesque Adirondacks.\u00a0<\/p>\n<h3>Poster Presentations<\/h3>\n<h1 style=\"margin: 0in 0in 0in 0.5in;font-size: 10pt;font-family: 'Times New Roman', serif;color: #000000;font-style: normal;font-weight: 400;letter-spacing: normal;text-transform: none;text-decoration: none;text-align: center;text-indent: -0.25in\" align=\"center\"><b>Monday, August 7, 5:40 \u2013 7:00 PM in\u00a0<i>Sentinel Range<\/i><\/b><\/h1>\n<p>\u00a0<\/p>\n<h2 style=\"text-indent: -.25in;margin: 0in 0in 6.0pt .25in\">1. \u00a0\u00a0<b>Surfactant-Mediated Non-Contact Dual Jet Cleaning for Post-CMP Wafer Surface,\u00a0<\/b><u>Wafi Aziz<sup>1<\/sup><\/u>, Takuo Sugioka<sup>2<\/sup>, Kazuya Date<sup>2<\/sup>, Yasushi Fujii<sup>2<\/sup>, Takako Harigae<sup>3<\/sup>, Mina Tsujiwaki<sup>3<\/sup>, and Jihoon Seo<sup>1<\/sup><\/h2>\n<h2 style=\"margin: 0in 0in 6pt 0.25in;font-size: 10pt;font-family: Arial, sans-serif;font-weight: normal;color: #000000;font-style: normal;letter-spacing: normal;text-align: start;text-indent: 0px;text-transform: none;text-decoration: none\">1Department of Chemical and Biomolecular Engineering, Clarkson University, Potsdam, NY,\u00a0<sup>2<\/sup>Electronics &amp; Environmental Solution Division, NIPPON SHOKUBAI CO., LTD., Osaka, Japan,\u00a0<sup>3<\/sup>Corporate Research Center, NIPPON SHOKUBAI CO., LTD., Osaka, Japan.<\/h2>\n<p><!-- [if !supportLists]-->2.\u00a0\u00a0\u00a0\u00a0\u00a0<!--[endif]--><b>Post-CMP Cleaning of Non-Spherical Abrasives Charged by Ion Spray or Carrying TRIBOELECTRIC CHARGES,\u00a0<\/b><u>Abbas Khanmohammadi<\/u>, Goodarz Ahmadi *<br \/>Department of Mechanical and Aerospace Engineering, Clarkson University, POTSDAM, NY, 13699, USA.<\/p>\n<p><!-- [if !supportLists]-->3.\u00a0\u00a0\u00a0\u00a0\u00a0<!--[endif]--><b>Robust\u00a0Sustainability\u00a0Analysis of CMP Consumable Manufacturing,\u00a0<\/b><u>Ravitej Venkataswamy<\/u><sup>1<\/sup>, Lyle Trimble<sup>1<\/sup>, Andrew McDonald<sup>2<\/sup>, Douglas Nevers<sup>3<\/sup>, Leticia Vazquez Bengochea<sup>2<\/sup>, Andrew Carswell<sup>2<\/sup>, Alan Rossner<sup>4<\/sup>\u00a0and\u00a0\u00a0Jihoon Seo<sup>1<\/sup>*<br \/><sup>1<\/sup>Department of Chemical &amp; Biomolecular Engineering, Clarkson University, Potsdam, NY,\u00a0USA.<br \/><sup>2<\/sup>DRAM CMP, Micron Technology Inc, Boise, ID,\u00a0USA.<br \/><sup>3<\/sup>NAND CMP, Micron Technology Inc, Boise, ID,\u00a0USA.<br \/><sup>4<\/sup>Institute for a Sustainable Environment, Clarkson University, Potsdam, NY, USA.<\/p>\n<p><!-- [if !supportLists]-->4.\u00a0\u00a0\u00a0\u00a0\u00a0<!--[endif]--><b>Toward Minimizing Ceria-Related Defects: An In-Depth Analysis of Ceria Removal Models and Their Associated Defects During Brush Scrubbing,\u00a0<\/b><u>Van-Tuan Nguyen<\/u><sup>1<\/sup>, James Wait<sup>2<\/sup>, Tomoya Nishi<sup>3<\/sup>, Satomi Hamada<sup>3<\/sup>, Hirokuni Himaya<sup>3<\/sup>, and Jihoon Seo<sup>1<\/sup>, USA,\u00a0<sup><br \/>1\u00a0<\/sup>Department of Chemical and Biomolecular Engineering, Clarkson University, Potsdam, NY,<br \/><sup>2\u00a0<\/sup>Department of Physics, Clarkson University, Potsdam, NY, USA,\u00a0<sup>3<\/sup>\u00a0EBARA Corporation, Fujisawa, Kanagawa 251-8502, Japan.<\/p>\n<p><!-- [if !supportLists]-->5.\u00a0\u00a0\u00a0\u00a0\u00a0<!--[endif]--><b>Environmentally Friendly Semiconductor Cleaning Solutions<\/b>,\u00a0Takako Harigae<sup>1<\/sup>, Mina Tsujiwaki<sup>1<\/sup>, Takuya Kamiyama<sup>1<\/sup>,\u00a0Kazuya Date<sup>2<\/sup>, Yasushi Fujii<sup>2<\/sup>,\u00a0<u>Takuo Sugioka<\/u>*<sup>2<\/sup><img loading=\"lazy\" decoding=\"async\" src=\"image\/png;base64,iVBORw0KGgoAAAANSUhEUgAAAAUAAAAPCAYAAAAs9AWDAAAAAXNSR0IArs4c6QAAAGxlWElmTU0AKgAAAAgABAEaAAUAAAABAAAAPgEbAAUAAAABAAAARgEoAAMAAAABAAIAAIdpAAQAAAABAAAATgAAAAAAAACQAAAAAQAAAJAAAAABAAKgAgAEAAAAAQAAAAWgAwAEAAAAAQAAAA8AAAAAXzDtVgAAAAlwSFlzAAAWJQAAFiUBSVIk8AAAAEZJREFUGBljYCAWMAMV\/ocqdgDSILyfBUg0AXEjEMMBE5yFxBh4QX6ga9yRXMQAcpIUENeiC8oCBdYiCzICOSC\/g7wKA3UAxFAHFMb+lvoAAAAASUVORK5CYII=\" width=\"5\" height=\"13\" \/><br \/><sup>1\u00a0<\/sup>Corporate Research Center, NIPPON SHOKUBAI Co., Ltd., Osaka\u00a0JAPAN,<br \/><sup>2\u00a0<\/sup>Electronics &amp; Environmental Solutions Division, NIPPON SHOKUBAI Co., Ltd., Osaka JAPAN.<\/p>\n<p><!-- [if !supportLists]-->6.\u00a0\u00a0\u00a0\u00a0\u00a0<!--[endif]--><b>Examining Leucine as an Environmentally Friendly Corrosion Inhibitor for Cu and Co Chemical-Mechanical Planarization (CMP),<\/b>\u00a0<u>Hoang Tran Thi Thuy<\/u>, Juster Gichovi, Jihoon Seo and Elizabeth Podlaha,<br \/>Department of Chemical and Biomolecular Engineering, Clarkson University, Potsdam, New York,\u00a0USA.<\/p>\n<p><!-- [if !supportLists]-->7.\u00a0\u00a0\u00a0\u00a0\u00a0<!--[endif]--><b>Sustainable Photoactive Nanocatalysts<\/b>,\u00a0<u>Chathura Wijethunga<\/u>\u00a0and Melissa King, Clarkson University, Potsdam, NY 13699, USA.\u00a0<\/p>\n<p><!-- [if !supportLists]-->8.\u00a0\u00a0\u00a0\u00a0\u00a0<!--[endif]--><b>Mechanisms of Material Removal for Molybdenum CMP Examined in the Tribo-Electrochemical Approach using Citrate and Percarbonate as Surface Modifiers,\u00a0<\/b><u>Kassapa Gamagedara<\/u>\u00a0and Dipankar Roy*,\u00a0<\/p>\n<p>Department of Physics, Clarkson University, Potsdam, New York 13699-5820,\u00a0USA.<\/p>\n<p><!-- [if !supportLists]-->9.\u00a0\u00a0\u00a0\u00a0\u00a0<!--[endif]--><b>Alternative Chemistries for SiC-CMP Slurry Formulations,\u00a0<\/b><u>Joseph L. Powell<\/u>, Heather Kamuda, and Jason J. Keleher*,<br \/>Department of Chemistry, Lewis University, Romeoville IL, 60446,\u00a0USA.<\/p>\n<p><!-- [if !supportLists]-->10.\u00a0\u00a0<!--[endif]--><b>Utilizing Megasonic Energy to Induce Chemically Active Low Shear Environments for Silicon Carbide (SiC) Cleaning,\u00a0<\/b><u>Adam T. Caridi<\/u>, Joseph L. Powell, Piper A. Smith, Jason J. Keleher*, Department of Chemistry, Lewis University, Romeoville IL, 60446,\u00a0USA.<\/p>\n<p><!-- [if !supportLists]-->11.\u00a0\u00a0<!--[endif]--><b>Stimuli Responsive Chemistry for Cu Enhanced Chemical Mechanical Planarization (CMP) Performance,\u00a0<\/b><u>Tatiana R. Cahue<\/u>, Kiana A. Cahue, Adam T. Caridi, Ara Philipossian, Yasa Sampurno, Jason J. Keleher*,<br \/>Department of Chemistry, Lewis University, Romeoville IL, 60446,\u00a0USA.<\/p>\n<p><!-- [if !supportLists]-->12.\u00a0\u00a0<!--[endif]--><b>Developing an Amine-Based Chemistry for Shallow Trench Isolation Post-CMP Cleaning,\u00a0<\/b><u>Kevin R. Reyes<\/u>, Nicole L. Courtenay, Ulysses I. Flores, and Jason J. Keleher*,<br \/>Department of Chemistry, Lewis University, Romeoville IL, 60446, USA.<\/p>\n<p><!-- [if !supportLists]-->13.\u00a0\u00a0<!--[endif]--><b>The Influence of Pad Micro-Feature Design on Chemical Mechanical Polishing (CMP) Performance: Insights from Computational Fluid Dynamics (CFD),\u00a0<\/b><u>Atefeh Sadri Mofakham<\/u><sup>1<\/sup>,\u00a0Hanchul Cho<sup>2<\/sup>, Hyongjae Kim<sup>2<\/sup>, Goodarz Ahmadi<sup>3<\/sup>\u00a0and Jihoon Seo<sup>1<\/sup><sub>,<br \/><\/sub><sup>1<\/sup>Department of Chemical and Biomolecular Engineering, Clarkson University, Potsdam, NY, USA,\u00a0<sup>2<\/sup>KITECH, Dongnam Division, Precision Mechanical Process and Control R&amp;D group, Principal Researcher, Busan, Republic of Korea,<br \/><sup>3<\/sup>\u00a0Department of Mechanical and Aerospace Engineering, Clarkson University, Potsdam, NY, USA.<\/p>\n<p><!-- [if !supportLists]-->14.\u00a0\u00a0<!--[endif]--><b>Application of Computational Fluid Dynamics for Predicting Chemical Mechanical Planarization Performance in Fabrication Processes,\u00a0<\/b><u>Atefeh Sadri Mofakham<sup>1<\/sup><\/u>, Jihoon Seo<sup>1<\/sup>\u00a0and Goodarz Ahmadi<sup>2<\/sup>,<sup><br \/>1<\/sup>Department of Chemical and Biomolecular Engineering, Clarkson University, Potsdam, NY, USA,\u00a0<sup>2<\/sup>Department of Mechanical and Aerospace Engineering, Clarkson University, Potsdam, NY, USA.<\/p>\n<p><!-- [if !supportLists]-->15.\u00a0\u00a0<!--[endif]--><b>Development and Application of a Post-CMP Cleaning Solution Reducing Ceria Contamination,\u00a0<\/b><u>Katie Gramigna<\/u>, Ping Tzeng, and Paul Bernatis,\u00a0Advanced Cleans Technology, DuPont, NEWARK, DE 19713, USA.<\/p>\n<p><!-- [if !supportLists]-->16.\u00a0\u00a0<!--[endif]--><b>Novel Polymer Materials: From Surface-Eroding and Recyclable Polyanhydrides to Sustainable and Functional Polyurethanes,\u00a0<\/b><u>Zinnat Morsada<\/u>, Pooja Yadav, Kashif Ijaz, Arielle Santefort, Ponsubha Sivabalan,\u00a0<u>Harini Gunasekaran<\/u>, Nikunjkumar Visaveliya, Devon A. Shipp*, Department of Chemistry &amp; Biomolecular Science, and Center for Advanced Materials Processing, Clarkson University, Potsdam NY 13699, USA.\u00a0<\/p>\n<p>\n<!-- \/* Style Definitions *\/ p.MsoNormal, li.MsoNormal, div.MsoNormal {mso-style-unhide:no; mso-style-qformat:yes; mso-style-parent:\"\"; margin:0in; mso-pagination:widow-orphan; text-autospace:none; font-size:10.0pt; font-family:\"Times New Roman\",serif; mso-fareast-font-family:\"MS Mincho\"; mso-fareast-language:EN-US;} h2 {mso-style-qformat:yes; mso-style-link:\"Heading 2 Char\"; mso-style-next:Normal; margin:0in; mso-pagination:widow-orphan; page-break-after:avoid; mso-outline-level:2; text-autospace:none; font-size:10.0pt; font-family:\"Arial\",sans-serif; mso-fareast-font-family:\"MS Gothic\"; mso-bidi-font-family:\"Times New Roman\"; mso-ansi-language:DE; mso-fareast-language:EN-US; font-weight:normal;} a:link, span.MsoHyperlink {mso-style-priority:99; color:#0563C1; mso-themecolor:hyperlink; text-decoration:underline; 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